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  • Proceedings Article January 01, 2011

    G. Wilkowski; B. Brust; T. Zhang; G. Hattery; S. Kalyanam; D.-J. Shim; E. Kurth; Y. Hioe; M. Uddin; J. J. Johnson; O. R. Maslenikov; A. Gürpinar; A. P. Asfura; B. Sumodobila; A. A. Betervide; O. Mazzantini

    Proc. ASME. 44519; Volume 1: Codes and Standards:107-120.January 01, 2011
    PVP2011-57939
    doi: 10.1115/PVP2011-57939